EN IEC 60068-2-10 Basic Environmental Test Procedures for Electronic Components and Electronic Equipment - Part 2: Tests - Test J: Mold Growth

This section of EN IEC 60068-2-10 provides a test method for determining the extent to which electrotechnical products support mold growth and how any mold growth may affect the product's performance and other related properties.

Because mold growth conditions involve high relative humidity, the test is applicable to electrotechnical products intended for transport, storage and use under humid conditions for at least a few days.

The main changes related to the previous version are listed below:

• Two test mushrooms were exchanged by two others,
• The concentration of spores identified for each test fungus,
• Spore suspension in mineral salt solution is additionally introduced,
• The preconditioning of the samples was explained by the prescribed moist heat storage,
• Supersonic aerosolization of spore suspension as the preferred method of inoculation,
• Incubation period reduced from 84 days to 56 days,
• The scope of mold growth grade 2 is divided into class 2a and class 2b.

The EN IEC 84-28-01 test is used to assess the extent of mold growth with a short exposure of 60068 days 2 to assess the effect of mold growth on the functioning of the sample with a longer exposure of 10 days.

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