CISPR 17 Methods of Measuring Suppression Properties of Passive EMC Filtering Devices

Electromagnetic and Electrical Tests

CISPR 17 Methods of Measuring Suppression Properties of Passive EMC Filtering Devices

EUROLAB laboratory provides testing and compliance services within the scope of CISPR 17 standard. The CISPR 17 standard specifies methods for measuring the radio interference suppression properties of passive EMC filtering devices used in power and signal lines and other circuits. The described methods can also be applied to combinations of surge protective devices and EMC filtering devices.

CISPR 17 Methods of Measuring Suppression Properties of Passive EMC Filtering Devices

The measurement method covers the frequency range from 9 kHz to several GHz, depending on the instrument and test circuit. The standard describes procedures for laboratory tests (type tests) as well as factory tests. The suppression properties of EMC filters and components used for suppressing EM disturbances are a function of numerous variables such as the impedance of the circuits to which they are connected, operating voltage and current, and ambient temperature.

This standard specifies uniform test methods that will enable comparison of filtration and suppression properties specified by testing laboratories or specified by manufacturers. Measurement procedures are provided for neutral and biased conditions. Measurements under bias conditions are performed to determine the potential nonlinear behavior of EMC filtering devices, such as saturation effects in magnetic core inductors. This test serves to demonstrate usability in a particular application (such as frequency converters that generate high amplitudes of common-mode pulse current and can therefore drive inductors to saturation).

If nonlinear behavior can be determined by other methods (for example, separate saturation measurement of the inductors used), measurement may not be performed under bias conditions. The first edition of CISPR 17 (1981) mainly stipulated measurement methods of insertion loss for power line filters. Today, however, many types of complex EMC filters and suppression components can be found in various electronic devices. These filters need to be characterized using standardized measurement methods. New methods for impedance measurement and S parameters for such EMI devices are included in this second edition.

The suppression characteristics of EMC filters and components used for suppressing EM disturbances, referred to in this standard as EMC filtering devices, are a function of numerous variables such as the impedance of the circuits to which they are connected, the operating voltage and current, and the environment. This standard specifies uniform test methods that will enable comparison of filtration and suppression properties specified by testing laboratories or specified by manufacturers.

Our organization, among numerous test, measurement, analysis and evaluation studies, provides testing methods of the Suppression Properties of CISPR 17 Passive EMC Filtering Devices to the demanding enterprises, within the framework of national and international standards, with its trained and expert staff and advanced technological equipment. Do not hesitate to contact our laboratory EUROLAB for your testing and certification requests.

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