IEC EN 61000-4-20 Electromagnetic Compatibility (EMC) - Part 4-20: Test and Measurement Techniques - Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides

Electromagnetic and Electrical Tests

IEC EN 61000-4-20 Electromagnetic Compatibility (EMC) - Part 4-20: Test and Measurement Techniques - Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides

EUROLAB, with its state-of-the-art accredited laboratories and expert team, provides precise and fast testing services within the scope of IEC EN 61000-4-20 testing. IEC EN 61000-4-20 focuses on emission and immunity test methods for electrical and electronic equipment using a variety of transverse electromagnetic (TEM) waveguides. These types include open structures (e.g. lane lines and electromagnetic pulse simulators) and closed structures (e.g. TEM cells).

IEC EN 61000-4-20 Electromagnetic Compatibility (EMC) - Part 4-20: Test and Measurement Techniques - Emission and Immunity Testing in Transverse Electromagnetic (TEM) Waveguides

These structures can also be classified as single-port, two-port, or multi-port TEM waveguides. The frequency range depends on the specific test requirements and the specific TEM waveguide type. The purpose of this standard is to describe TEM waveguide specifications, including typical frequency ranges and equipment under test (EUT) size limitations.

This standard is not intended to specify tests to be applied to any particular apparatus or systems. The main purpose of this standard is to provide a general basic reference for all relevant product committees of the IEC. For radiated emissions measurements, product committees select emission limits and measurement methods in consultation with CISPR standards. For radiation immunity testing, product committees remain responsible for the appropriate selection of immunity tests and immunity test limits to be applied to the equipment within their scope.

The use of a transmission line setup avoids distortion from ground reflected fields, as in a semi-anechoic chamber setup; therefore, uniform fields can be created around the inner and outer conductors.

In principle, the uniform field can be located at any distance from the input port; the location will depend on the particular waveguide geometry. The uniform field is valid only for this distance from the input port where it was calibrated.

EUT type is a group of products with sufficient similarity in electromagnetic properties or mechanical dimensions that are allowed to be tested with the same test setup and same test protocol. The EUT type and configuration apply to immunity and emission tests to allow a uniform regulation of the test volume.

EUROLAB assists manufacturers with IEC EN 61000-4-20 test compliance. Our test experts, with their professional working mission and principles, provide you, our manufacturers and suppliers, the best service and controlled testing process in our laboratories. Thanks to these services, businesses receive more effective, high-performance and quality testing services and provide safe, fast and uninterrupted service to their customers.

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