IEC EN 61000-5-5 Electromagnetic Compatibility (EMC) - Part 5: Installation and Mitigation Guidelines - Part 5: Test for Specification of Conductive Distortion

Electromagnetic and Electrical Tests

IEC EN 61000-5-5 Electromagnetic Compatibility (EMC) - Part 5: Installation and Mitigation Guidelines - Part 5: Test for Specification of Conductive Distortion

EUROLAB, with its state-of-the-art accredited laboratories and expert team, provides precise and fast testing services within the scope of IEC EN 61000-5-5 testing. This section of IEC EN 61000-5 defines how to determine protective devices for conducted disturbance recommended for HEMP protection. It is intended to be used for harmonization of current or future specifications issued by protective device manufacturers, electronic equipment manufacturers, governments and other end-users.

IEC EN 61000-5-5 Electromagnetic Compatibility (EMC) - Part 5: Installation and Mitigation Guidelines - Part 5: Test for Specification of Conductive Distortion

This chapter covers protective devices currently used for protection against HEMP transients induced in signal and low-voltage power lines (rated voltage up to 1 kV ac). The general information can also be applied to high voltage lines. In these cases, however, additional requirements for the protection levels of existing lightning rods (especially backlash-free MO-arresters) are taken into account.

In general, parameters related to HEMP, that is, parameters related to very rapid changes of electromagnetic field, voltage (u) and current (i) as a function of time, are of interest. For core specifications, reference is made to other relevant standards dealing with events other than HEMP. When such standards do not adequately take into account the requirements of modern electronics, additional specifications, modifications or extensions based on standards not related to HEMP are defined.

In protective diodes, the conduction is very fast and there is no visible time delay in the nanosecond range. However, in the conventional two-lead configuration, this fast movement can be completely masked by the voltage drop in the inductance of the leads when subjected to high di/dt. Under HEMP conditions, the residual voltage of a protective diode is the sum of the inductive voltage drop and the clamping voltage. Since the two peaks do not occur simultaneously, in most cases they can be treated independently.

EUROLAB assists manufacturers with IEC EN 61000-5-5 test compliance. Our test experts, with their professional working mission and principles, provide you, our manufacturers and suppliers, the best service and controlled testing process in our laboratories. Thanks to these services, businesses receive more effective, high-performance and quality testing services and provide safe, fast and uninterrupted service to their customers.

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