XRD (X-Ray Diffraction) Analysis

Electromagnetic and Electrical Tests

XRD (X-Ray Diffraction) Analysis

X-ray diffraction (XRD) is a widely used analysis method to evaluate the crystallinity and structure of solid samples.

XRD (X-Ray Diffraction) Analysis

In this technique, the crystalline X-ray diffraction phenomenon results from a scattering process in which X-rays are scattered by the electrons of the atoms present in the sample without changing the wavelength. Since the wavelengths of X-rays are comparable to the interatomic spacing of a crystalline solid, the incident X-ray diffracts in specific directions. The diffraction pattern, given by the positions and intensities of the diffraction effects, is a fundamental physical property of the material and allows not only the description but also the full disclosure of its structure.

X-ray powder diffraction analyzes are commonly used to identify unknown crystalline materials, such as minerals and inorganic compounds. Identifying unknown solids is critical for studies in geology, environmental science, materials science, engineering, and biology.

Other application areas are: characterization of crystalline materials, identification of fine-grained minerals such as clays and mixed-layer clays that are difficult to detect optically, determination of unit cell dimensions and measurement of sample purity.

The strengths of X-ray diffraction analyzes are:

  • Powerful and fast technique for identifying an unknown mineral (results in 20 minutes maximum)
  • In most cases, it provides a precise mineral determination
  • Minimal sample preparation is required
  • XRD units are widely available
  • Data interpretation is relatively simple

The limitations of this technique are as follows:

  • Homogeneous and single-phase material is best for identification of an unknown substance
  • Inorganic compounds must have access to a standard reference file
  • Requires a tenth gram of material to be pulverized
  • The detection limit for mixed materials is approx. 2 percent of the sample
  • For unit cell determinations, indexing models for non-isometric crystal systems is complex.
  • For high angle reflections, the overhead layer can form and deteriorate

In short, with X-ray diffraction technique, the average spacing between layers or atomic rows is measured, the orientation of a single crystal or grain is determined, the crystal structure of an unknown material is found, and the size, shape and internal tension of small crystal regions are measured.

Our organization also provides XRD (X-ray diffraction) analysis services with its trained and expert staff and advanced technological equipment, among the numerous test, measurement, analysis and evaluation studies it provides for businesses in various sectors.

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