SEM Scanning Electron Microscopy

Scanning Electron Microscope or SEM analysis provides high-resolution imaging useful for evaluating a variety of materials for surface fractures, defects, contaminants, or corrosion. Thanks to SEM and EDX analysis, our metallurgical experts provide a comprehensive review of material properties and provide manufacturers with valuable information.

SEM analysis is a powerful research tool that uses a focused electron beam to produce complex, highly magnified images of surface topography of a sample. Once an area of ​​interest has been identified on the sample and evaluated using SEM, our specialists can dive deeper into the details of the material using energy diffuser x-ray spectroscopy or EDX analysis.

Why SEM analysis?

Performing a visual analysis of a surface using a scanning electron microscope contributes to the detection of contaminants or unknown particles, the cause of the malfunction, and the interactions between the materials.

In addition to surface assessment, SEM analysis is used for particle characterization, such as wear residues produced during the mechanical wear test. Our SEM analysis supports high magnification, high resolution imaging, determining the number, size and morphology of small particles, allowing customers to understand the wear properties of their materials.

Combining SEM and EDX Analysis

Energy diffuser x-ray spectroscopy, also called EDX, EDS or EDAX, provides a better understanding of the surface material during the SEM analysis process. EDX analysis is used to obtain the elemental composition of a sample and provides a more quantitative result than that provided only by SEM analysis. The combination of SEM and EDX analysis offers chemical composition and basic research and provides a comprehensive metallurgical evaluation.