Advanced technical ceramics with the EUROLAB Laboratory EN 1071-4 standard. Test methods for ceramic coatings. It accredits tests for the determination of chemical composition by electron probe microanalysis (EPMA), describes methods for the chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyzer. The methods described are limited to examining single-layer coatings when the analysis is done normally to the sample surface, but graduated and multi-layer coatings can also be analyzed in cross-section if the thickness of the individual layers or grades is greater than that normal to the sample surface. The maximum width of the material volume from which characteristic or fluorescent X-rays are produced.
identifiers
Wavelengths, Accuracy, Special ceramics, X-ray devices, Wave properties and phenomena, Surface properties, Chemical composition, Spectra, Content determination, Ceramic coatings, Scattering (waves), Coatings, Sample preparation, Spectroscopy, Optical instruments, Scanning electron microscopes , Ceramics, Interventions (chemical), Microanalysis, Chemical analysis and tests
This European Standard describes methods for the chemical analysis of ceramic coatings by means of electron probe microanalysis (EPMA) using a scanning electron microscope (SEM) or an electron probe microanalyzer.
Our other test standards
ISO 13383-1
Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 1: Determination of grain size and size distribution.
EN 843-1
Special technical ceramics. Monolithic ceramics. Mechanical properties at room temperature. Part 1: Determination of flexural strength.
EN 843-5
Advanced technical ceramics - Monolithic ceramics. Mechanical properties at room temperature - Part 5: Statistical analysis.
ISO 13383-2
Fine ceramics (advanced ceramics, advanced technical ceramics) - Microstructural characterization - Part 2: Determination of phase volume fraction by evaluation of micrographs.
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